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Output beam profile. (ring radius/distance) ≈ 0.08

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Cover page for JMR Focus Issue: Graphene and beyond

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Figure 1: The I24 beamline hutch

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Figure 2: The Optofluidics particle trapping process [1]

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Figure 3: Diagram representing the optofluidic chip architecture

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Figure 4: Photograph of 3 separate 400nm particles which have been successfully trapped above the waveguide. [2]

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Outgassing results showing the change in H2 partial pressure with 50 keV electron dose during 60 second electron irradiation.

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First successful run of new tower, using catalyst monitoring device developed during MRes project

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NG Figure 4

NG Figure 4

Figure 4. The nano-Newton torsion balance can be seen within the vacuum chamber below. The balance utilises a highly compliant torsional spring to support the balance beam, the angular displacement of which is measured using a phase shifting homodyne angular interferometer with 633 nm HeNe laser. The entire system is calibrated using an electrostatic fin system which is traceable to national standards. The balance is expected to have a resolution below 10 nanoNewtons under medium vacuum with a range of up to 300 micro-Newtons in this configuration. To help achieve this, the entire balance assembly is constructed from Invar and mounted using slotted pins to mitigate thermal effects.

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NG Figure 2

NG Figure 2

Figure 2. An overview of mechanisms and their associated time scales within light-matter interactions induced by short pulses [8].

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NG Figure 1

NG Figure 1

Figure 1. Applications of lasers in materials processing [1]. Operations such as cutting, drilling and etching generally occur on timescales longer than microseconds at low to moderate intensities. Operations such as laser ablation, surface modification and deposition occur on timescales approaching nanoseconds at high intensity. No single laser can perform across the range of intensity and interaction time. The grey boxes shown are more like ‘grey areas’, as many more laser parameters, material properties and interaction pathways have to be considered.

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